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Kennedy - External Micrometer, 50-75mm Measuring Range, 0.01mm Graduation - KEN3350030K
Enamelled frame and tungsten carbide tipped anvils. Manufactured to BS 870.
Supplied in a durable plastic case.
Flatness: 0.6mm.
Parallelism: (2 + L/100) µm
(fraction rounded down).
Instrumental error: ±(1 + L/75) µm
(fraction rounded up).
L = maximum measuring length
More Information
| SKU |
KEN3350030K |
| Product Model No |
KEN3350030K |
| brand |
Cromwell |
